Spring 2009
Optical and Scanning Probe Microscopies and Their Applications in the Materials and Life Sciences
Draft for a Spring 2009 Class
Hannes C. Schniepp
Course Description
Spring (3) Prerequisites: Permission by Instructor
This course covers the two complimentary families of imaging techniques: optical microscopy and scanning probe methods. Both the fundamentals and applications will be discussed, so that students who use or plan to use these techniques in their research projects will obtain a strong background. The following topics will be included: geometric and wave optics, optical imaging, basic forms of light–matter interaction, all major optical microscopy modes (including fluorescence and confocal), interfacial forces, atomic force microscopy, scanning tunneling microscopy, near-field optics.
0 Introduction |
1 Optical Microscopy |
1.1 Fundamentals of Classical Optics |
1.2 Light–Matter Interactions |
1.3 High-Aperture Imaging |
1.4 Modes of Wide-Field Microscopy |
1.5 Confocal Microscopy |
1.6 Applications and Practical Aspects |
1.7 * Subdiffraction Techniques |
1.8 * Special Techniques |
1.9 Optical Components |
1.10 Image Processing and Software |
2 Scanning Probe Microscopy |
2.1 Overview and History |
2.2 Scanning Tunneling Microscopy |
2.3 General Principles of Scanning Probe Microscopy |
2.4 Static-Mode Atomic Force Microscopy (AFM) |
2.5 Dynamic-Mode AFM |
2.6 Liquid-Cell Operation |
2.7 Force Spectroscopy |
2.8 Biological Applications |
2.9 * Electric and Magnetic Field Modes |
2.10 * Scanning Near-Field Optical Microscopy |
2.11 * Special Techniques |
2.12 Practical Aspects |